Morphogenesis of Silicovanadate Glasses: Investigation of Physical Properties

Md. Moinul Islam; Md. Abdur Rashid; Md. Parvez Ahamed; Md. Emran Hossain; M. Rafiqul Ahsan; M. Golam Mortuza; Mirza Humaun Kabir Rubel

doi:10.38032/jea.2021.02.003

Authors

Md. Moinul Islam Department of Physics, University of Rajshahi, Rajshahi–6205, Bangladesh
Md. Abdur Rashid Department of Physics, University of Rajshahi, Rajshahi–6205, Bangladesh
Md. Parvez Ahamed Department of Physics, University of Rajshahi, Rajshahi–6205, Bangladesh
Md. Emran Hossain Physics Discipline, University of Khulna, Khulna–9208, Bangladesh
M. Rafiqul Ahsan Department of Physics, University of Rajshahi, Rajshahi–6205, Bangladesh
M. Golam Mortuza Department of Physics, University of Rajshahi, Rajshahi–6205, Bangladesh
Mirza Humaun Kabir Rubel Department of Materials Science and Engineering, University of Rajshahi, Rajshahi–6205, Bangladesh

DOI:

https://doi.org/10.38032/jea.2021.02.003

Keywords:

Si/V-based glass, FTIR, X-ray diffraction, DTA, pH, Current-Voltage characteristics, Electrical resistivity

Abstract

In this article, we demonstrate the synthesis and various characterizations of silicovanadate glasses of xSiO₂ (100-x)V₂O₅for x = (10-50) mol%, glasses which are prepared by the melt quenching method. FTIR spectra analysis confirms dominant chemical bonds among silicon, vanadium, and oxygen elements as expected. The assigned chemical bonds are Si-O-Si, O-Si-O, V-O-V, V=O, Si-O-V, O-H from FTIR spectra. The IR spectra of all glass specimens were baseline corrected and deconvoluted to distinct peaks of chemical bonds in overlapped Gaussians with employing computer program. The chemical bond's position shifted and affected due to the addition of vanadium pentaoxide by the heat treatment process. The X-ray diffractions (XRD) patterns of glass samples exhibit partial crystalline nature for 10S90V and 50S50V that is influenced by high-temperature application. The differential thermal analysis (DTA) of base and heat-treated specimen determines the glass transition (T_g), crystallization, and liquidus temperature with prominent exothermic and endothermic reactions. It is seen that the pH of the glass specimens abruptly changes due to the surface effect of V₂O₅while bulk effects become robust after about 30 minutes. The measured hardness of three glass samples shows high H_V-values and a slight linear increment is observed for higher V₂O₅ contents. The current-voltage (I-V) characteristic connected to the electrical conductivity of the glass specimen (20S80V) shows a relatively higher and non-linear trend of conductivity which reveals the behavior of a semiconductor. Moreover, temperature-dependent electrical resistivity measurement of the same sample (20S80V) manifests the semiconducting nature up to 427 °C as well.

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